Karr, A. F., S. G. Eick, T.L. Graves, J. S. Marron, and H. Siy. "Predicting fault incidence using software change history." IEEE Transportation Software Engineering 26 (2000): 653?661.Individual Authors: Alan F. KarrStephen G. EickTodd GravesJ.S. MarronHarvey Siy BibTeX RTF Tagged XML
