The ITSEW is an annual workshop on analysis of - and methodology for - multiple survey errors. The theme of the 2012 International Total Survey Error Workshop is “Total Survey Error: Past, Present, and Future”. Topics include presentations of research that explore or analyze the trade-offs of two or more sources of survey error within the context of relatively recent methodological or statistical approaches.
Topics in the scope of the 6th ITSEW are:
- Analysis of relation between nonresponse and measurement error (interviewer effects, contact or refusal conversion strategies)
- Design of questionnaires for multiple survey modes
- Decomposing mode effects
- Mixed-mode data collection design including Internet web surveys
- Quality of longitudinal data from Internet panels
- Quality of paradata
- Adaptive/responsive survey designs accounting for multiple errors.
The programme of Sunday September 2 consists of registration, a welcome reception and an opening session.
Program Committee:
Paul Biemer, RTI and University of North Carolina
Mick Couper, University of Michigan
Marcel Das, CentERdata, Tilburg University
David Dolson, Statistics Canada
Brad Edwards, Westat
Joop Hox, Utrecht University
Lars Kaczmirek, Gesis, Germany
Edith de Leeuw, Utrecht University
Lars Lyberg, University of Stockholm
Gerry Nicolaas, Natcen, UK
Barry Schouten, Statistics Netherlands
Sunday, September 2 - TSE Discussion Papers
Evidence of a Coverage-Nonresponse Trade-off
STEPHANIE ECKMAN
Error Tradeoffs in Cross-National and Comparative Surveys: Questionnaire Design from a Total Survey Quality Perspective
GORDON WILLIS
Monday, September 3
Session 1: Quality & Costs
A Tool for Managing Product Quality
PAUL BIEMER
Framework for Empirical Cost Modeling Relating Cost and Data Quality
MARY MULRY
The World's Simplest Survey Microsimulator (WSSM): A Tool for Understanding Total Survey Error
ALAN KARR
Session 2: Estimation in Mixed-Mode Surveys
Disentangling Mode-Specific Selection and Measurement Bias in Social Surveys
JAN VAN DER LAAN
Evaluating Mode Effects in Mixed-Mode Data Using Back-Door, Front-Door, and Instrumental Variables
JORRE VANNIEUWENHUYZE
Systematic and Random Error in a Mixed Mode Online-Telephone Survey: An MTMM approach
JOOP HOX
Inference in Surveys with Sequential Mixed-Mode Data Collection
JAN VAN DEN BRAKEL
Session 3: The Interaction Between Survey Errors
Evaluating the Extent of Non-Response and Non-Coverage Bias in the Swiss European Social Survey
CAROLINE VANDENPLAS
Examining Interviewer Behavior in Handling Difficult Cases
WENDY HICKS
What is the Impact of Mode Effect on Non-Response Survey Usability?
CAROLINE VANDENPLAS
Poster Presentations:
BELLA STRUMINSKAYA:Challenges of Assessing the Quality of a Prerecruited Probability-Based Panel of Internet Users in Germany
VALERIE TUTZ: Placement, Wording, and Interviewer Effects: Experiments in Obtaining Data Linkage Consent from Survey Respondents
Tuesday, September 4
Session 4: Components of Total Survey Error
A Total Survey Error Analysis of an Address-Based Sampling Survey
TING YAN
Social Network Analysis as a Tool for Assessing Respondent Burden, Measurement Error and Nonresponse in Establishment Surveys
DIANE WILLIMACK
A Model-Based Procedure to Evaluate the Relative Effects of Different TSE Components on Structural Equation Model Parameter Estimates
DANIEL OBERSKI
Analytic Error as an Important Component of Total Survey Error: Results from a Meta-Analysis
JOE SAKSHAUG
Session 5: The Impact of Survey Mode on Survey Error
Using Measurement Models to Locate the Sources of Survey Mode Bias
THOMAS KLAUSCH
Study of Mode Effects in an Embedded Experiment
PETER LUNDQUIST
An Evaluation of Three Surveys Among Non-Western Minorities in the Netherlands with Respect to Nonresponse and Measurement Error
JOOST KAPPELHOF
Session 6: Designs Accounting for Total Survey Error
Adaptive Survey Designs that Minimize Nonresponse and Measurement Risk
BARRY SCHOUTEN
How Much Do Planned Missing Designs Increase Survey Error In Longitudinal Panel Studies?
VERONICA ROTH
Planned Missing-Data Designs and Statistical Matching: A Smart Response to Minimising Total Survey Error?
FEMKE DE KEULENAER
Event Type
- NISS Sponsored